We have demonstrated that the integrated circuit test structures fabricated at standard commercial foundries can be radiation tolerant at total does greater than 100krad ( si ) . the radiation environment of outer space is capable of effecting cmos devices in three ways 外太空辐射环境主要以三种方式影响cmos器件：总剂量辐射效应( tid ) ，单粒子翻转效应( seu )和单粒子闩锁效应( sel ) 。
